About AXIC, Inc.
axic, inc. was founded in 1980 to provide x-ray measurement of semiconductor thin films. axic's patented technology of combining edx and wdx detectors for xrf analysis demonstrated s... Read more
axic, inc. was founded in 1980 to provide x-ray measurement of semiconductor thin films. axic's patented technology of combining edx and wdx detectors for xrf analysis demonstrated s... Read more